M04000 - SEMI M40 - Guide for Measurement of Roughness of Planar Surfaces on Polished Wafers StdTpc-Flat Panel Display SEMI E142-0305 (first published)

SEMI E142-0305 (first published)

and other methods of measuring electrostatic parameters

External leadframe finishes are not included

and adds Prober Job state model to GEM Standard requirements and capabilities

) or specific instance of equipment

M04000 - SEMI M40 - Guide for Measurement of Roughness of Planar Surfaces on Polished Wafers StdTpc-Flat Panel Display SEMI E142-0305 (first published)This Guide incorporates the following methodologies: Standardized scan patterns for both local and full area surface characterization, A set of roughness abbreviations that describe measurement conditions in a short hand code, and Reference test methodologies for three generic types of roughness measuring instruments. These general categories may include, but are not limited to: Profilometers AFM and other scanning probe microscopes; optical